Press Releases

Tuesday 24. February 2009
Automated module and component test

Hitex presents a new release of the proven module/unit test tool Tessy.

Thursday 15. January 2009
LPC-Stick family with considerable growth

With two new USB sticks Hitex has extended their wide portfolio of USB evaluation sticks.

Monday 15. December 2008
Ethernet and OLED control made easy

Hitex offers an extension board for the popular UConnect XE164 USB-Stick.

Wednesday 03. December 2008
Tool Qualification Package according to DO-178B for Tessy

If a safety-critical project is developed according to the avionics standard DO-178B, a qualification of the development tools may be necessary.

Monday 01. September 2008
DeviceScan simplifies error detection

Hitex Development Tools introduces DeviceScan, a diagnosis system especially designed for testing microcontrollers that are already integrated in final products.