Chip Test with DeviceScan

DeviceScan

DeviceScan is based on the customer’s need to be able to distinguish in case of a system failure between a defective microcontroller or another fault. It is especially designed for testing microcontrollers that are already integrated in final products. In particular, the system allows to detect whether an error in the application systems stems from the microcontroller or not – even after the microcontroller is already soldered onto the board.

The basic principle is the use of the processor’s single scan chain mode (SSCM). In this mode the same test patterns used for the internal structural test of a device in production are applied over the JTAG interface.

Based on the USB-driven Tantino hardware, DeviceScan manages the test vectors, controls the test run and analyses the test results. It is able to test a complex CPU (like TC1766) with a level of testing coverage of 95 % in about 2 minutes.

DeviceScan is currently available for

  • XC2000
  • TC1766


The DeviceScan package includes:

  • DeviceScan unit
  • Communication cable (USB)
  • DeviceScan test software (CD ROM including electronic documentation)